The probe card is a device that connects semiconductor chips and test equipment to inspect the
operation of semiconductors. The probe tip mounted on the probe card contacts the wafer and sends electricity,
and then selects defective semiconductor chips according to the signal that returns.

Where probe card is used?

• Front End

• Wafer Burn-in TEST

• Electronic
  Die Sort TEST

• Cutting

• Packaging

Our probe card is used in the wafer burn in test and DIE sort test stages of the semiconductor manufacturing process.